This project delves into the principles of interference, particularly focusing on how light waves interact with very thin films, like those seen in soap bubbles or oil slicks.

Advances in thin film metrology are discussed by Dr. Max Junda and Dr. Lyle Gordon, highlighting measurement challenges and ...

Historical Archive Crinkled films can stop reflection 17 Jun 2002 A new way of introducing nanoridges enables the control of surface optical properties Swiss researchers have developed thin-film ...

X-ray reflectometry (XRR) is a non-destructive technique for characterizing thin films, providing nanoscale insights into thickness, density, and roughness for applications in semiconductors, ...