This project delves into the principles of interference, particularly focusing on how light waves interact with very thin films, like those seen in soap bubbles or oil slicks.

Advances in thin film metrology are discussed by Dr. Max Junda and Dr. Lyle Gordon, highlighting measurement challenges and ...

The reflective filter maintains narrow bandwidth, high throughput, and blocking over a wide wavelength range. Narrow notch rejection filters - Due to the nature of thin-film interference filters, ...

X-ray reflectometry (XRR) is a non-destructive technique for characterizing thin films, providing nanoscale insights into thickness, density, and roughness for applications in semiconductors, ...

Thus the fact that a very thin transparent film is black when viewed by reflected light leads to the conclusion that a light wave is altered in phase by half a wave-length on reflection, either at ...